The first part of the test is based on half-bridge sub-module topology, shown below:

For thorough, reliable tests, eight kinds of tests are designed:

At the beginning of each designed test, the system should be initialized.

Initialize the Parameters of MMC Parameter Block

Variable	Set value	Reason
SM Type	0: Half-bridge	Tests designed for Half-bridge topology
cell capacitance (farads)	0.01	A test value, may vary
switch Ron (ohms)	0	Remove voltage drop on Ron
capacitor shunt resistance (ohms)	1e12	Disable discharge by Rshunt
Number of cell per arm	10	Total number need to be tested
[Sb Vb] power and voltage bases	[10 10]	So for each cell, the SI and PU values are the same, i.e. 1 A is 1 pu for current and 1 V is 1 pu for voltage.
Vcap mode	Set to fixed value	To initialize and fix the Vcap=Vcap value
Vcap fix value (pu)	0	To initialize and fix the Vcap=0
Pulse source	Direct gate signal from CPU	Control cells using Gate Signals block

Initialize the Parameters of Arm Current Generation Block

Arm Current Generation block initialization setup

variables	Set value	reason
DC current	ones(6,1)*0.1	Some tests need an arm current pulse with magnitude of 0.1 and duration of 0.01 s. this initialization can generate this arm current easily.
AC magnitude	ones(6,1)*0
Frequency	ones(6,1)*50
Form of the current	1.Current with a duration
Pulse duration	ones(6,1)*0.01